激光对HgCdTe的损伤降解研究
激光诱导热-力耦合损伤的数值模拟与预测模型
该组文献侧重于利用数学建模和有限元分析(如COMSOL)来研究激光照射下的热效应、热应力分布以及损伤预测。研究涵盖了连续波激光、纳米秒脉冲及多波长复合激光对光学元件和光电二极管的损伤机理。
- Modeling for the thermal stress damage of the optical elements induced by high energy laser(Zhaokai Lou, Kai Han, Min-sun Chen, Baozhu Yan, Yi Yang, Hao Liu, Jian Chen, Xiao Li, 2018, No journal)
- Numerical analysis of the thermal effect of the spaceborne detector irradiated by the pulsed laser carried by the accompanying satelite(Xiaodong Ren, W. Lei, Jinying Tang, Yong Wang, 2018, 2018 International Conference on Electronics Technology (ICET))
- Laser damage prediction under composite multi-wavelength irradiation based on field-thermal-stress coupled model.(Zhen Wang, Xinda Zhou, Yinbo Zheng, Jie Li, Rongzhu Zhang, 2026, Optics express)
- Numerical research on thermal effect of photodiode damaged by nanosecond pulsed laser(M. Yao, Jifei Ye, Lan Li, Heyan Gao, Mingyu Li, Hongjie Kong, 2021, Sixteenth National Conference on Laser Technology and Optoelectronics)
HgCdTe材料的微观物理特性与损伤形貌分析
该组文献专注于HgCdTe材料在激光作用下的微观变化,包括非线性吸收行为(双光子吸收)、材料组分演化(如汞析出)、形貌改变以及损伤后的热恢复过程,涉及对MBE生长材料的表征。
- Two-Photon Absorption Behavior of HgCdTe Material(Y. Chang, S. Sonde, I. Chang, W. Gao, S. Velicu, 2025, Journal of Electronic Materials)
- Thermal recovery processes in laser irradiated HgCdTe (PC) detectors.(F. Bartoli, L. Esterowitz, M. Kruer, R. Allen, 1975, Applied optics)
- Morphology and chemical composition analysis on multi-pulsed CO2 laser ablation of HgCdTe crystals(Wei Tang, Jin Guo, Junfeng Shao, Tingfeng Wang, 2013, No journal)
- Characterisation of MBE Grown HgCdTe Using Scanning Laser Microscopy(C. Musca, V. Chan, R. Sewell, J. Dell, L. Faraone, 2004, Conference on Optoelectronic and Microelectronic Materials and Devices, 2004.)
激光对探测器器件的性能干扰与失效机理
该组文献从器件层面研究激光对HgCdTe成像传感器、光伏阵列的干扰和损伤效应。研究重点在于激光诱导电流(LBIC)定性分析、像元响应失效、读出电路损坏以及激光对红外探测系统的干扰机制。
- Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity(B. Park, R. Westerhout, G. Tsen, C. Musca, John M. Dell, L. Faraone, 2008, 2008 Conference on Optoelectronic and Microelectronic Materials and Devices)
- The mechanism of laser disturbing infrared detector and its intelligent protection(Yuan Lu, Yun-song Feng, Y. Ling, Y. Qiao, 2013, No journal)
- Photo-induced damage mechanism of photovoltaic array HgCdTe detector(Shuai Qiao, Rui Wang, X. Hou, 2022, No journal)
- Experimental study of HgCdTe imaging sensor irradiated by pulse CO2 laser(Xi Wang, Qingsheng Wang, Hongtao Hu, X. Fang, Jin-song Nie, 2016, No journal)
本组论文涵盖了激光对HgCdTe材料及探测器损伤研究的三个关键维度:一是理论与仿真,通过建立热-力耦合模型定量预测损伤阈值;二是材料科学,分析激光诱导的微观组分变化与形貌演变;三是工程应用,评估激光对探测器性能的干扰效果及最终失效模式。这些研究共同构成了从基础物理机制到器件失效评估的完整研究链条。
总计12篇相关文献
It is of great significance to research the laser irradiation effect and failure mechanism of the detector to optimize its performance. In this paper, the 512×1 linear array HgCdTe detector was used as the research object to study its damage phenomenon and mechanism. We used a picosecond pulsed laser with a wavelength of 1064 nm to irradiate the line array HgCdTe detector and found that some pixels of the detector were damaged when the laser energy density was greater than 700 mJ/cm2, and the damaged pixels showed different degrees of response without light conditions, but other undamaged pixels could respond normally. In one experiment, the detector was completely unable to respond normally when the laser energy was too large. To research the mechanism of laser-induced detector damage, we detected the damaged detector chip by using scanning electron microscopy and established a three-dimensional simulation model using COMSOL Multiphysics simulation software. Research showed that the temperature of the chip was too high and mercury was precipitated under high-energy laser irradiation, then the material composition changed and the resistance of the PN junction depletion layer changed accordingly, resulting in the damaged pixels showing different degrees of response without light conditions, but undamaged pixels could respond normally. When the readout circuit pin was damaged by a high-energy laser, the detector was completely unable to respond normally.
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An analytical model for laser-induced damage under composite dual/multi-wavelength irradiation is established for a multilayer film. It is a field-thermal-stress coupled model that can predict the damage types under varying ratios of the fundamental harmonic (1ω) energy and its complementary third harmonic (3ω). Both the theoretical and experimental results revealed that the film damage is asymmetric on the front and rear surfaces. At a fixed total laser energy, the front surface primarily exhibited field-induced damage when the 1ω energy ratio reached 95%. However, as this ratio decreased to 92% or below, the front surface damage evolved into nanoscale fracture-type damage, dominated by field-stress coupling. In contrast, regardless of the energy ratio, damage sites on the rear surface consistently manifested as micrometer-scale remelted structures, dominated by thermal-stress coupling. The theoretical predictions agree well with experimentally observed damage morphologies and Raman spectral changes, validating the applicability and reliability of the model.
The thermal stress damage of optical elements always restrict the development of high power laser system. We studied the thermal damage mechanism of the optical elements with contaminants induced by high power continuous wave (CW) lasers. An experiment was carried out by a self-build optical element testing platform and a model based on the temperature field theory and thermodynamic theory was set up. We recorded the thermal stress damage process based on a 10 kW/cm2 level mid-infrared continuous wave laser. Then we calculated the thermal damage process of optical elements. The calculated results are in agreement with our experimental record. The results showed the success of modeling calculation in the thermal damage mechanism caused by contaminants.
In order to better study the damage effect of nanosecond pulsed laser on PIN photodiodes, a two-dimensional axisymmetric model and heat source model of nanosecond irradiation photodiodes were established according to the theory of heat conduction, and the factors of thermal physical parameters changing with temperature were considered. The finite element COMSOL Multiphysics software was used to simulate the temperature field distribution of PIN photodiodes irradiated by nanosecond pulse lasers. The research results show that the temperature change trend of the target surface under different energy densities is consistent, and there is a phenomenon of energy ac-cumulation. From the center of the irradiation to the edge of the target, the temperature gradually weakens and dis-tributes in a gradient. and the temperature rise rate of the target is directly proportional to the increase in energy density. It is found that the melting damage of the photodiode is reached. The range of energy density is, 144.01mJ/cm2 ~ 175.58 mJ/cm2 , The research results provide a theoretical basis for the research field of laser damage to materials.
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本组论文涵盖了激光对HgCdTe材料及探测器损伤研究的三个关键维度:一是理论与仿真,通过建立热-力耦合模型定量预测损伤阈值;二是材料科学,分析激光诱导的微观组分变化与形貌演变;三是工程应用,评估激光对探测器性能的干扰效果及最终失效模式。这些研究共同构成了从基础物理机制到器件失效评估的完整研究链条。